{"title":"IEEE Transactions on electromagnetic compatibility: An overview","authors":"M. D'amore","doi":"10.1109/ICSMC2.2003.1428178","DOIUrl":null,"url":null,"abstract":"The technical-scientific contents of the Transactions on EMC (EMC-T) are inspired to the main objectives of the EMC Society: \"The IEEE EMC Society strives for the enhancement of electromagnetic compatibility through the generation of engineering standards, measurement techniques and test procedures, measuring instruments, equipment and systems characteristics, improved techniques and components, education in EMC and studies of the origins of interference.\" The elements on which the development of EMC-T should be founded are described in the paper. The topics focus primarily on the electromagnetic fields, the circuits and the measurements; the methodologies can be analytical, numerical, and experimental; and the applications concern numerous different industrial sectors","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428178","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The technical-scientific contents of the Transactions on EMC (EMC-T) are inspired to the main objectives of the EMC Society: "The IEEE EMC Society strives for the enhancement of electromagnetic compatibility through the generation of engineering standards, measurement techniques and test procedures, measuring instruments, equipment and systems characteristics, improved techniques and components, education in EMC and studies of the origins of interference." The elements on which the development of EMC-T should be founded are described in the paper. The topics focus primarily on the electromagnetic fields, the circuits and the measurements; the methodologies can be analytical, numerical, and experimental; and the applications concern numerous different industrial sectors
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