E. Grund, Thomas Chang, R. Watkins, C. Burke, Justin Katz, R. Gauthier
{"title":"A New CDM Discharge Head for Increased Repeatability and Testing Small Pitch Packages","authors":"E. Grund, Thomas Chang, R. Watkins, C. Burke, Justin Katz, R. Gauthier","doi":"10.23919/EOS/ESD.2018.8509749","DOIUrl":null,"url":null,"abstract":"Charged Device Model testing is confronted with high operating frequencies driving CDM to lower voltage levels and by high-density packages with ever smaller ball/pin pitches. A new CDM discharge head design meets these challenges by making DUT contact first and then an internal spark discharge occurs in a controlled environment.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509749","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Charged Device Model testing is confronted with high operating frequencies driving CDM to lower voltage levels and by high-density packages with ever smaller ball/pin pitches. A new CDM discharge head design meets these challenges by making DUT contact first and then an internal spark discharge occurs in a controlled environment.
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