Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

Abstract

Ensuring the safe operation of electronic systems requires them to comply with electromagnetic compatibility (EMC) regulations. We can achieve this by conducting various EMC tests, including checking electromagnetic emission limits and immunity to interference signals, both on integrated circuit (IC) and on system level. However, these tests are typically performed separately, without considering the potential impact of one test on another. In this paper we present a framework to address this issue by simulation and subsequent post-processing. We focus on the impact of radio frequency (RF) disturbances on the electromagnetic emission of an IC, and propose a framework based on LTspice and Python, that implements the direct power injection (DPI) characterisation method and the 150 Ohm method. Within this paper we demonstrate the usability of this framework and how the resulting plot can support circuit designers in developing EMC compliant circuits. To do so, we utilise a test circuit, where the electromagnetic emission is significantly altered by an RF disturbance.