{"title":"The change in the interface-state Fermi level of M.I.S. solar cells when going from dark to illuminated conditions","authors":"O. Nielsen","doi":"10.1049/IJ-SSED:19790013","DOIUrl":null,"url":null,"abstract":"Current/voltage characteristics obtained under dark and illuminated conditions have been examined for Al-p-Si M.I.S. solar cells. The results show that the voltage drop across the oxide is changed, owing to the increased surface concentration of minority carriers when going from dark to illuminated conditions. The inverse slopes nof the linear region have been measured and the interface-state densities NSS have been calculated. From the voltage changes and interface state densities obtained, the changes in the interface-state Fermi levels have been calculated to be about 0.05–0.1 eV for short-circuit currents of 25–30 mA cm−2","PeriodicalId":127114,"journal":{"name":"Iee Journal on Solidstate and Electron Devices","volume":"139 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iee Journal on Solidstate and Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/IJ-SSED:19790013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Current/voltage characteristics obtained under dark and illuminated conditions have been examined for Al-p-Si M.I.S. solar cells. The results show that the voltage drop across the oxide is changed, owing to the increased surface concentration of minority carriers when going from dark to illuminated conditions. The inverse slopes nof the linear region have been measured and the interface-state densities NSS have been calculated. From the voltage changes and interface state densities obtained, the changes in the interface-state Fermi levels have been calculated to be about 0.05–0.1 eV for short-circuit currents of 25–30 mA cm−2
研究了Al-p-Si M.I.S.太阳能电池在黑暗和光照条件下获得的电流/电压特性。结果表明,由于少数载流子的表面浓度增加,当从黑暗到照明条件下,氧化物上的电压降发生了变化。测量了非线性区域的逆斜率,计算了界面态密度NSS。根据得到的电压变化和界面态密度,计算出短路电流为25-30 mA cm−2时,界面态费米能级的变化约为0.05-0.1 eV