A Staggered Nand Dram Array Architecture For A Gbit Scale Integration

S. Shiratake, D. Takashima, T. Hasegawa, H. Nakano, Y. Oowaki, S. Watanabe, K. Ohuchi, F. Masuoka
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引用次数: 3

Abstract

Cascade arrangement of DRAM cells, NAND structured DRAM cell, have already been proposed to reduce the cell size[l] and the experimental 256Mbit chip has been fabricated to demonstrate a small chip size[2]. However, realizing IGbit or further, the NAND DRAM faces a crucial array noise problem due to its open bitline (BL) array arrangement which has larger array noise than the folded BL arrangement[3]. The conventional NAND DRAM inevitably adopts the open BL arrangement, because memory cells are placed a t all the intersection between wordlines and bitlines, so all the BL’s receive the cell data when a wordline is activated, accordingly reference BL’s cannot be arranged in the same memory mat. To overcome this problem, we propose a Staggered NAND DRAM array architecture which realizes folded BL scheme in a NAND DRAM.
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用于Gbit级集成的交错Nand Dram阵列架构
级联排列的DRAM单元,即NAND结构的DRAM单元,已经被提出用于减小单元尺寸[1],并且已经制作了256Mbit的实验芯片来演示小芯片尺寸[2]。然而,在实现IGbit或更深入的过程中,NAND DRAM由于其开位线(BL)阵列排列比折叠位线排列[3]具有更大的阵列噪声而面临着一个关键的阵列噪声问题。传统的NAND DRAM不可避免地采用开放的BL排列方式,由于存储单元被放置在所有字线和位线的交叉点上,因此当一个字线激活时,所有的BL都接收到单元数据,因此不能将参考BL排列在同一块内存中。为了克服这一问题,我们提出了一种交错NAND DRAM阵列架构,在NAND DRAM中实现折叠BL方案。
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