A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov
{"title":"Hartmannometer versus Fizeau Interferometer: advantages and drawbacks","authors":"A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov","doi":"10.1117/12.2085263","DOIUrl":null,"url":null,"abstract":"In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photonics West - Optoelectronic Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2085263","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.
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