{"title":"Analysis of the dendrite on printed wiring board by soft X-ray microscope and THz imaging: Structure of the dendrite in Ion-migration","authors":"K. Mitobe, Masafumi Suzuki, N. Yoshimura","doi":"10.1109/ICPES.2011.6156691","DOIUrl":null,"url":null,"abstract":"Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.","PeriodicalId":158903,"journal":{"name":"2011 International Conference on Power and Energy Systems","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Power and Energy Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPES.2011.6156691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.
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