Considerations on the C-V Characteristics of Pentacene Metal-Insulator-Semiconductor Capacitors

Abstract

C-V characteristics of pentacene MIS capacitors are obtained with various measurement conditions. High measuring frequency can decrease the measured capacitance due to the slow response of holes. When thick semiconductor is used, accurate C-V characteristics can not be obtained due to the resistance of bulk semiconductor. Bias stress makes positive or negative flat band voltage shift, also complicate accurate C-V measurement. Therefore, to obtain reliable C- V characteristics of organic MIS capacitors, these properties should be considered.