{"title":"Step Size Influence on Defocused Beam Ptychography","authors":"Ziyang Hu","doi":"10.1364/cosi.2022.cth3c.3","DOIUrl":null,"url":null,"abstract":"We discuss the influence of overlapping parameter using Fermat spiral scan in a defocused beam ptychography configuration. It shows a high efficiency in exposure distribution and image reconstruction quality using extended ptychography iterative engine (ePIE).","PeriodicalId":286361,"journal":{"name":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/cosi.2022.cth3c.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We discuss the influence of overlapping parameter using Fermat spiral scan in a defocused beam ptychography configuration. It shows a high efficiency in exposure distribution and image reconstruction quality using extended ptychography iterative engine (ePIE).