M. Labib, Dina G. Mahmoud, G. Alkady, I. Adly, H. Amer, R. Daoud, H. Elsayed
{"title":"Heterogeneous Redundancy for PCB Track Failures: An Automotive Example","authors":"M. Labib, Dina G. Mahmoud, G. Alkady, I. Adly, H. Amer, R. Daoud, H. Elsayed","doi":"10.1109/ICCES48960.2019.9068123","DOIUrl":null,"url":null,"abstract":"Reliability is a very important aspect in electronic components used in the Automotive industry. Due to the harsh environments in this industry, Printed Circuit Board (PCB) tracks are a very common cause of failure. This paper proposes a scheme that will increase the reliability of chip-to-chip interconnections. The scheme relies on the availability of unused microcontroller IO ports. It is shown how to implement a 1-out-of-2 (or even 1-out-of-3) fault-tolerant communication channel. To illustrate the advantage of the proposed scheme, communication channel reliability is calculated with and without fault tolerance and a use case indicates that the increase in reliability can be significant.","PeriodicalId":136643,"journal":{"name":"2019 14th International Conference on Computer Engineering and Systems (ICCES)","volume":"1838 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 14th International Conference on Computer Engineering and Systems (ICCES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCES48960.2019.9068123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Reliability is a very important aspect in electronic components used in the Automotive industry. Due to the harsh environments in this industry, Printed Circuit Board (PCB) tracks are a very common cause of failure. This paper proposes a scheme that will increase the reliability of chip-to-chip interconnections. The scheme relies on the availability of unused microcontroller IO ports. It is shown how to implement a 1-out-of-2 (or even 1-out-of-3) fault-tolerant communication channel. To illustrate the advantage of the proposed scheme, communication channel reliability is calculated with and without fault tolerance and a use case indicates that the increase in reliability can be significant.