{"title":"A test strategy for mixed analog/digital ASICS","authors":"P. Valdenaire, C. Gauthron","doi":"10.1109/EASIC.1990.207958","DOIUrl":null,"url":null,"abstract":"Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs.<<ETX>>","PeriodicalId":205695,"journal":{"name":"[Proceedings] EURO ASIC `90","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] EURO ASIC `90","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EASIC.1990.207958","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs.<>