{"title":"Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)","authors":"M. Charles, D. Allal","doi":"10.1109/CPEM.2014.6898318","DOIUrl":null,"url":null,"abstract":"Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898318","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
