Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898598
R. Lapuh, B. Voljc, M. Lindic
The paper describes frequency dependence correction of the Agilent 3458A DMM in DCV sampling mode. The biggest error source identified is the input filter roll-off, which was measured and evaluated with an asynchronous sampling technique using phase sensitive sine fit algorithm. Corrected response is flat within 50 μV/V in the whole audio frequency band.
{"title":"Accurate measurement of AC voltage in audio band using Agilent 3458A sampling capability","authors":"R. Lapuh, B. Voljc, M. Lindic","doi":"10.1109/CPEM.2014.6898598","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898598","url":null,"abstract":"The paper describes frequency dependence correction of the Agilent 3458A DMM in DCV sampling mode. The biggest error source identified is the input filter roll-off, which was measured and evaluated with an asynchronous sampling technique using phase sensitive sine fit algorithm. Corrected response is flat within 50 μV/V in the whole audio frequency band.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121048087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1142/S0217979215410027
C. Palmisano, G. Mana
The measurand value, the conclusions, and the decisions inferred from measurements may depend on the models used to explain and to analyze the results. In this paper, the problems of identifying the most appropriate model and of assessing the model contribution to the uncertainty are formulated and solved in terms of Bayesian model selection and model averaging. The computational cost of this approach increases with the dimensionality of the problem. Therefore, a numerical strategy to integrate over the nuisance parameters and to compute and to sample the measurand post-data distribution is also outlined.
{"title":"The expression of the model uncertainty in measurements","authors":"C. Palmisano, G. Mana","doi":"10.1142/S0217979215410027","DOIUrl":"https://doi.org/10.1142/S0217979215410027","url":null,"abstract":"The measurand value, the conclusions, and the decisions inferred from measurements may depend on the models used to explain and to analyze the results. In this paper, the problems of identifying the most appropriate model and of assessing the model contribution to the uncertainty are formulated and solved in terms of Bayesian model selection and model averaging. The computational cost of this approach increases with the dimensionality of the problem. Therefore, a numerical strategy to integrate over the nuisance parameters and to compute and to sample the measurand post-data distribution is also outlined.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121073827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898601
W. Fang, T. Crowley
The correction factor of the National Institute of Standards and Technology's WR-15 (50 to 75 GHz) microcalorimeters has been re-evaluated. Use of modeled values for the reflection coefficient of a flat short and offset short instead of measured values results in lower uncertainties in the evaluation of the calorimeter correction factor obtained with these artifacts. The uncertainties are now comparable to that of an evaluation technique in which two calorimeter cores are directly connected to each other. Improvements in a fourth technique were also achieved with an improved measurement of the transmission coefficient of a line section. The differences in the derived correction factors are a little larger than would be expected based on the uncorrelated uncertainties. The source of the discrepancy has not been determined.
{"title":"Improvement in the evaluation of a rectangular waveguide microcalorimeter correction factora","authors":"W. Fang, T. Crowley","doi":"10.1109/CPEM.2014.6898601","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898601","url":null,"abstract":"The correction factor of the National Institute of Standards and Technology's WR-15 (50 to 75 GHz) microcalorimeters has been re-evaluated. Use of modeled values for the reflection coefficient of a flat short and offset short instead of measured values results in lower uncertainties in the evaluation of the calorimeter correction factor obtained with these artifacts. The uncertainties are now comparable to that of an evaluation technique in which two calorimeter cores are directly connected to each other. Improvements in a fourth technique were also achieved with an improved measurement of the transmission coefficient of a line section. The differences in the derived correction factors are a little larger than would be expected based on the uncorrelated uncertainties. The source of the discrepancy has not been determined.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127297792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898603
L. Brunetti, L. Oberto, M. Sellone, N. Shoaib, E. Vremera
This paper describes hardware and software improvements of the INRIM coaxial microcalorimeter together with their effect on the primary power standard realization in the frequency band 0.05 - 40 GHz. A better temperature and power stabilization turned out to provide an improved signal/noise ratio and a drift reduction in every working condition of the microcalorimeter. Results are presented in form of a 2.92 mm thermoelectric power sensor calibration together with graphs that show the improved stability and repeatability of the measurement system.
{"title":"Improvements on INRIM coaxial microcalorimeter","authors":"L. Brunetti, L. Oberto, M. Sellone, N. Shoaib, E. Vremera","doi":"10.1109/CPEM.2014.6898603","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898603","url":null,"abstract":"This paper describes hardware and software improvements of the INRIM coaxial microcalorimeter together with their effect on the primary power standard realization in the frequency band 0.05 - 40 GHz. A better temperature and power stabilization turned out to provide an improved signal/noise ratio and a drift reduction in every working condition of the microcalorimeter. Results are presented in form of a 2.92 mm thermoelectric power sensor calibration together with graphs that show the improved stability and repeatability of the measurement system.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127354122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898532
L. Robertsson, H. Fang, M. Stock
This paper describes a new interferometer that is being developed for the velocity measurement of the BIPM watt balance. An Iodine stabilized Nd:YAG laser is used together with space separated heterodyning techniques to allow for small nonlinear errors and high phase resolution. First results will be presented.
{"title":"A new interferometer for the BIPM watt Balance","authors":"L. Robertsson, H. Fang, M. Stock","doi":"10.1109/CPEM.2014.6898532","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898532","url":null,"abstract":"This paper describes a new interferometer that is being developed for the velocity measurement of the BIPM watt balance. An Iodine stabilized Nd:YAG laser is used together with space separated heterodyning techniques to allow for small nonlinear errors and high phase resolution. First results will be presented.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124984923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898534
J. Jung, A. Faisal, Young Seob Lee, Kyu-Tae Kim
A capacitor-resistor combined bank to calibrate both the capacitance ratio and dissipation factor of the commercial capacitance and tan δ measuring bridge is fabricated. The fabricated portable working standards as a secondary standard for ratio calibration are realized by connecting the double shielded capacitors in parallel employing the substitution and build-up technique, whereas, the standards for dissipation calibration are attained by connecting shielded capacitors in parallel with a shielded T-resistor network. The calibration results for the several commercial bridges are presented and compared with specification provided by manufacturer including the measurement uncertainty.
{"title":"Fabrication of capacitor-resistor bank for calibrating commercial capacitance and tan δ measuring bridge","authors":"J. Jung, A. Faisal, Young Seob Lee, Kyu-Tae Kim","doi":"10.1109/CPEM.2014.6898534","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898534","url":null,"abstract":"A capacitor-resistor combined bank to calibrate both the capacitance ratio and dissipation factor of the commercial capacitance and tan δ measuring bridge is fabricated. The fabricated portable working standards as a secondary standard for ratio calibration are realized by connecting the double shielded capacitors in parallel employing the substitution and build-up technique, whereas, the standards for dissipation calibration are attained by connecting shielded capacitors in parallel with a shielded T-resistor network. The calibration results for the several commercial bridges are presented and compared with specification provided by manufacturer including the measurement uncertainty.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125194285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898290
J. Ireland, D. Henderson, Jonathan M. Williams, O. Kieler, J. Kohlmann, R. Behr, J. Gran, H. Malmbekk, K. Lind, Chi Kwong Tang
The optoelectronic coupling for a pulse-driven Josephson junction array (JJA) for use as a quantum voltage synthesizer has been designed. This system uses optoelectronic components to drive a group of JJAs in parallel. Since the drive system is electrically isolated from the JJAs, they can be connected in series, leading to a higher output voltage. A thin film circuit, including interdigitated capacitors to couple a photodiode to the JJAs has been designed and tested and shown to meet the design goals.
{"title":"An optoelectronic coupling for pulse-driven Josephson junction arrays","authors":"J. Ireland, D. Henderson, Jonathan M. Williams, O. Kieler, J. Kohlmann, R. Behr, J. Gran, H. Malmbekk, K. Lind, Chi Kwong Tang","doi":"10.1109/CPEM.2014.6898290","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898290","url":null,"abstract":"The optoelectronic coupling for a pulse-driven Josephson junction array (JJA) for use as a quantum voltage synthesizer has been designed. This system uses optoelectronic components to drive a group of JJAs in parallel. Since the drive system is electrically isolated from the JJAs, they can be connected in series, leading to a higher output voltage. A thin film circuit, including interdigitated capacitors to couple a photodiode to the JJAs has been designed and tested and shown to meet the design goals.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125922570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898335
J. Kopanski
Electrical modes of scanning probe microscopes have found considerable metrology applications in integrated circuits and emerging nano-electronic devices. This paper will review the critical metrology needs that electrical SPMs have addressed in the integrated circuit industry and further applications for the characterization of nano-electronic devices. Solutions to metrology problems addressed by electrical SPM modes including the scanning capacitance microscope (SCM), scanning Kelvin force microscope (SKFM), scanning microwave microscope (SMM), scanning spreading resistance microscope (SSRM), conductive-AFM (c-AFM), and magnetic force microscopy (MFM) will be reviewed.
{"title":"Electrical scanning probe microscopes to address industrial nano-metrology needs of integrated circuits and nanoelectronic devices","authors":"J. Kopanski","doi":"10.1109/CPEM.2014.6898335","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898335","url":null,"abstract":"Electrical modes of scanning probe microscopes have found considerable metrology applications in integrated circuits and emerging nano-electronic devices. This paper will review the critical metrology needs that electrical SPMs have addressed in the integrated circuit industry and further applications for the characterization of nano-electronic devices. Solutions to metrology problems addressed by electrical SPM modes including the scanning capacitance microscope (SCM), scanning Kelvin force microscope (SKFM), scanning microwave microscope (SMM), scanning spreading resistance microscope (SSRM), conductive-AFM (c-AFM), and magnetic force microscopy (MFM) will be reviewed.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"237 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123753429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898360
Y. Amagai, M. Maruyama, H. Yamamori, Shih-Fang Chen, H. Fujiki, N. Kaneko
We are developing a 10-Vrms low-frequency sampling measurement system using an AC-programmable Josephson voltage standard (AC-PJVS). Our AC-PJVS circuit is composed of NbN-based over-damped Josephson junctions cooled with a compact cooler. A PJVS chip with 524,288 junctions increases the maximum measurable root-mean-square (rms) voltage up to 10 V at a microwave bias of 15.9 GHz. We have obtained a differential waveform between the stepwise-approximated waveforms of the AC-PJVS and the sinusoidal waveforms of a calibrator.
{"title":"Development of 10-Vrms sampling measurement system using AC-programmable Josephson voltage standard","authors":"Y. Amagai, M. Maruyama, H. Yamamori, Shih-Fang Chen, H. Fujiki, N. Kaneko","doi":"10.1109/CPEM.2014.6898360","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898360","url":null,"abstract":"We are developing a 10-Vrms low-frequency sampling measurement system using an AC-programmable Josephson voltage standard (AC-PJVS). Our AC-PJVS circuit is composed of NbN-based over-damped Josephson junctions cooled with a compact cooler. A PJVS chip with 524,288 junctions increases the maximum measurable root-mean-square (rms) voltage up to 10 V at a microwave bias of 15.9 GHz. We have obtained a differential waveform between the stepwise-approximated waveforms of the AC-PJVS and the sinusoidal waveforms of a calibrator.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125542556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898541
D. Lindenthaler
This investigation contributes to the power calculation of electric motors which are driven by pulse-width-modulation (PWM). In digital measurement systems, PWM signals have an undesired property: their spectra are broadly extended. The fulfilment of the sampling theorem requires the band limitation of the signals, which in turn influences the result of the power calculation. This paper presents a method for the calculation of the band limitation error for PWM signals and analyses the magnitude of this error in a numerical study.
{"title":"Signal-bandwidth evaluation for electric power calculation in PWM driven motors","authors":"D. Lindenthaler","doi":"10.1109/CPEM.2014.6898541","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898541","url":null,"abstract":"This investigation contributes to the power calculation of electric motors which are driven by pulse-width-modulation (PWM). In digital measurement systems, PWM signals have an undesired property: their spectra are broadly extended. The fulfilment of the sampling theorem requires the band limitation of the signals, which in turn influences the result of the power calculation. This paper presents a method for the calculation of the band limitation error for PWM signals and analyses the magnitude of this error in a numerical study.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115461001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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