Pietro Saltarelli, Behrad Niazmand, J. Raik, V. Govind, T. Hollstein, G. Jervan, R. Hariharan
{"title":"A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC Routers","authors":"Pietro Saltarelli, Behrad Niazmand, J. Raik, V. Govind, T. Hollstein, G. Jervan, R. Hariharan","doi":"10.1145/2786572.2788713","DOIUrl":null,"url":null,"abstract":"The focus of the paper is detection of faults in NoC routers by combining concurrent checkers with embedded on-line test to enable cost-effective trade-offs between area-overhead and test coverage. First, we propose a framework of tools for formally evaluating the quality of the checkers and for optimizing the overhead area with given fault coverage constraints. The stress is in particular on the minimization of the error detection latency, which is a crucial aspect in order to eliminate (or limit) error propagation. Second, the concurrent checkers will be complemented by embedded on-line test packets which are to be applied as a periodic routine during the idle periods in router operation. The framework together with the corresponding methodology has been successfully applied to a realistic case-study of a fault tolerant NoC router design. The case study shows that combining concurrent routers with embedded test allows reducing the area overhead of the checkers from 31--35% down to 1.5--10% without sacrificing the fault coverage.","PeriodicalId":228605,"journal":{"name":"Proceedings of the 9th International Symposium on Networks-on-Chip","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 9th International Symposium on Networks-on-Chip","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2786572.2788713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
The focus of the paper is detection of faults in NoC routers by combining concurrent checkers with embedded on-line test to enable cost-effective trade-offs between area-overhead and test coverage. First, we propose a framework of tools for formally evaluating the quality of the checkers and for optimizing the overhead area with given fault coverage constraints. The stress is in particular on the minimization of the error detection latency, which is a crucial aspect in order to eliminate (or limit) error propagation. Second, the concurrent checkers will be complemented by embedded on-line test packets which are to be applied as a periodic routine during the idle periods in router operation. The framework together with the corresponding methodology has been successfully applied to a realistic case-study of a fault tolerant NoC router design. The case study shows that combining concurrent routers with embedded test allows reducing the area overhead of the checkers from 31--35% down to 1.5--10% without sacrificing the fault coverage.