A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC Routers

Pietro Saltarelli, Behrad Niazmand, J. Raik, V. Govind, T. Hollstein, G. Jervan, R. Hariharan
{"title":"A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC Routers","authors":"Pietro Saltarelli, Behrad Niazmand, J. Raik, V. Govind, T. Hollstein, G. Jervan, R. Hariharan","doi":"10.1145/2786572.2788713","DOIUrl":null,"url":null,"abstract":"The focus of the paper is detection of faults in NoC routers by combining concurrent checkers with embedded on-line test to enable cost-effective trade-offs between area-overhead and test coverage. First, we propose a framework of tools for formally evaluating the quality of the checkers and for optimizing the overhead area with given fault coverage constraints. The stress is in particular on the minimization of the error detection latency, which is a crucial aspect in order to eliminate (or limit) error propagation. Second, the concurrent checkers will be complemented by embedded on-line test packets which are to be applied as a periodic routine during the idle periods in router operation. The framework together with the corresponding methodology has been successfully applied to a realistic case-study of a fault tolerant NoC router design. The case study shows that combining concurrent routers with embedded test allows reducing the area overhead of the checkers from 31--35% down to 1.5--10% without sacrificing the fault coverage.","PeriodicalId":228605,"journal":{"name":"Proceedings of the 9th International Symposium on Networks-on-Chip","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 9th International Symposium on Networks-on-Chip","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2786572.2788713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

The focus of the paper is detection of faults in NoC routers by combining concurrent checkers with embedded on-line test to enable cost-effective trade-offs between area-overhead and test coverage. First, we propose a framework of tools for formally evaluating the quality of the checkers and for optimizing the overhead area with given fault coverage constraints. The stress is in particular on the minimization of the error detection latency, which is a crucial aspect in order to eliminate (or limit) error propagation. Second, the concurrent checkers will be complemented by embedded on-line test packets which are to be applied as a periodic routine during the idle periods in router operation. The framework together with the corresponding methodology has been successfully applied to a realistic case-study of a fault tolerant NoC router design. The case study shows that combining concurrent routers with embedded test allows reducing the area overhead of the checkers from 31--35% down to 1.5--10% without sacrificing the fault coverage.
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NoC路由器低延迟故障检测并发检测与在线嵌入式测试相结合的框架
本文的重点是通过将并发检查器与嵌入式在线测试相结合来检测NoC路由器中的故障,从而在面积开销和测试覆盖率之间实现经济有效的权衡。首先,我们提出了一个工具框架,用于正式评估检查器的质量,并在给定故障覆盖约束下优化架空区域。重点是最小化错误检测延迟,这是消除(或限制)错误传播的关键方面。其次,并发检查器将由嵌入式在线测试包补充,该测试包将在路由器运行空闲期间作为周期性例程应用。该框架和相应的方法已成功地应用于容错NoC路由器设计的实际案例研究中。案例研究表明,将并发路由器与嵌入式测试相结合,可以在不牺牲故障覆盖率的情况下,将检查器的面积开销从31—35%降低到1.5—10%。
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