Free-Space Permittivity Measurement for Inhomogeneous PSV-Coated Si-wafer at Frequencies from 75 GHz to 325 GHz

Sohyeon Jung, Moogoong Choo, Jae-Yeong Lee, In-sung Ahn, Kangseop Lee, W. Hong
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引用次数: 1

Abstract

A method to extract dielectric property of inhomogeneous PSV (Passivation)-coated Si-wafer is presented at broadband frequencies from 75 GHz to 325 GHz. Free-space measurement using continuous wave (CW) system is carried out. Numerical iterative algorithm is employed to extract permittivity from complex scattering parameters. Due to scarcity of related previous studies beyond 100 GHz, the discussions on parameters that may affect the results are also described in detail. The calculated permittivity based on the proposed method highly correlates with the analytical values.
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非均匀psv包覆硅片在75 GHz至325 GHz频率下的自由空间介电常数测量
提出了一种在75 GHz ~ 325 GHz宽带频段提取非均匀钝化硅片介电特性的方法。利用连续波(CW)系统进行自由空间测量。采用数值迭代算法从复散射参数中提取介电常数。由于前人在100ghz以上的相关研究较少,本文还对可能影响结果的参数进行了详细的讨论。基于该方法计算出的介电常数与解析值高度相关。
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