Efficient simulation framework for circuit design with future device technologies [MOS structures]

R. Gottsche, T. Schulz, N. Bruls, W. Krautschneider
{"title":"Efficient simulation framework for circuit design with future device technologies [MOS structures]","authors":"R. Gottsche, T. Schulz, N. Bruls, W. Krautschneider","doi":"10.1109/ESSDER.2004.1356570","DOIUrl":null,"url":null,"abstract":"A simulation framework has been developed for fast and accurate calculation of MOS transistor characteristics. It is based on an optimized table model so that it can be run solely using experimental or simulated I-V data, i.e. without any time-consuming determination of model parameters. This model is designed in a very flexible manner, thus it can be used for advanced MOS structures, such as double-gate and FinFET transistors, as well. By this means, it facilitates the integration of a parameterized device technology directly into a conventional design flow to qualify circuits in the design space.","PeriodicalId":287103,"journal":{"name":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDER.2004.1356570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A simulation framework has been developed for fast and accurate calculation of MOS transistor characteristics. It is based on an optimized table model so that it can be run solely using experimental or simulated I-V data, i.e. without any time-consuming determination of model parameters. This model is designed in a very flexible manner, thus it can be used for advanced MOS structures, such as double-gate and FinFET transistors, as well. By this means, it facilitates the integration of a parameterized device technology directly into a conventional design flow to qualify circuits in the design space.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
面向未来器件技术的高效电路设计仿真框架[MOS结构]
为了快速准确地计算MOS晶体管的特性,开发了一个仿真框架。它基于一个优化的表模型,因此它可以单独使用实验或模拟的I-V数据运行,即不需要任何耗时的模型参数确定。该模型以非常灵活的方式设计,因此它可以用于先进的MOS结构,例如双栅和FinFET晶体管。通过这种方式,它有助于将参数化器件技术直接集成到传统设计流程中,从而在设计空间中确定电路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Bias stress in pentacene transistors measured by four probe transistor structures Interface passivation mechanisms in metal gated oxide capacitors Modeling of STI-induced stress phenomena in CMOS 90nm Flash technology A novel method for forming gate spacer and its effects on the W/WN/sub x//poly-Si gate stack Gate-capacitance extraction from RF C-V measurements [MOS device applications]
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1