The exponential fitting of optical threshold and analyses of testing errors

Da-wei Li, J. Shao, Yuanan Zhao, Kui Yi, H. Qi
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Abstract

The effect of irradiated spot size and number of sites exposed for each pulse energy or power density on damage possibility is studied. It is shown that larger irradiating spot size and more sites tested for each pulse energy or power density, more accurate damage data could be obtained. Also the effect of defect distribution should be taken into account and it also affects the accuracy of damage threshold determination. A new method, exponential fitting, is described and it yields more accurate damage onset. And it is derived from but suitable to more than all-degeneration model.
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光学阈值的指数拟合及测试误差分析
研究了每一脉冲能量或功率密度下辐照点大小和暴露点数目对损伤可能性的影响。结果表明,每个脉冲能量或功率密度的辐照斑尺寸越大,测试的部位越多,得到的损伤数据越准确。缺陷分布的影响也会影响损伤阈值确定的准确性。本文提出了一种新的方法,即指数拟合方法,该方法可以得到更精确的损伤起始点。它不仅适用于所有退化模型,而且也适用于所有退化模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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