{"title":"On the detectability of parametric faults in analog circuits","authors":"J. Savir, Zhen Guo","doi":"10.1109/ICCD.2002.1106781","DOIUrl":null,"url":null,"abstract":"This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.","PeriodicalId":164768,"journal":{"name":"Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2002.1106781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22
Abstract
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.
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