Resonances in photoemission from semiconductors with negative electron affinity

L. Gerchikov, A. Subashiev
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Abstract

Summary form only given, as follows. The variation of the photoemission from the negative electron affinity (NEA) semiconductor surface with the position of the surface Fermi level is theoretically studied. Resonance maxima both in photoyield and the surface recombination rate (when the depth and the width of the quantum well in the band bending region (BBR) are close to the appearance of the new quantum level) are predicted as a result of quantum character of the electron motion in the BBR. The resonance BBR transmission is expected to manifest itself in the temperature, doping, and thickness of the activation layer photoyield dependence. The experimental studies of the dependencies should help to monitor the evolution of the BBR during surface activation to the NEA state.
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具有负电子亲和的半导体的光发射共振
仅给出摘要形式,如下。从理论上研究了负电子亲和半导体表面的光电发射随表面费米能级位置的变化规律。由于带弯曲区(BBR)中电子运动的量子特性,预测了光产率和表面复合率的共振最大值(当带弯曲区量子阱的深度和宽度接近新量子能级的外观时)。共振BBR传输预计将表现在温度、掺杂和激活层厚度的光产率依赖性上。依赖性的实验研究将有助于监测BBR在表面活化到NEA状态期间的演变。
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