F. Fengler, M. Park, T. Schenk, M. Pešić, U. Schroeder
{"title":"Field Cycling Behavior of Ferroelectric HfO2-Based Capacitors","authors":"F. Fengler, M. Park, T. Schenk, M. Pešić, U. Schroeder","doi":"10.1016/B978-0-08-102430-0.00017-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":401168,"journal":{"name":"Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-08-102430-0.00017-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}