Angled high strain rate shear testing for SnAgCu solder balls

T. Chai, D.Q. Yu, J. Lau, W.H. Zhu, X.R. Zhang
{"title":"Angled high strain rate shear testing for SnAgCu solder balls","authors":"T. Chai, D.Q. Yu, J. Lau, W.H. Zhu, X.R. Zhang","doi":"10.1109/ECTC.2008.4550037","DOIUrl":null,"url":null,"abstract":"A high speed shear test of solder ball at different shear angles has been developed and investigated for SnAgCu solder balls. The objective of the test is to introduce vertical loading component in the high speed shear test and to study intermetallic response of different solder balls. The shear test is performed at three angles of attack e. g. 3, 5 and 10 degree. The basic shear tester allow high speed shear tool movement of up to 4000 mm per second, and capture the load-displacement curve experienced by the shear tool. Using this setup, high-speed shear characterization has been carried out on microBGA sample with Sn3Ag0.5Cu and Sn1Ag0.5Cu solder on Ni/Au pad finish. In this paper, the effect of angle shear at high speed on these SnAgCu BGA balls is presented, with the details of load-displacement response and failure mode for these solder balls. Generally all the samples show changes in ductile-to-brittle failure as shear speed increases. The angled shear test lead to down shift of ductile-brittle transition to occur at lower shear speed with larger shear angle. It is found to improve sensitivity in revealing brittle failure for solder ball characterization.","PeriodicalId":378788,"journal":{"name":"2008 58th Electronic Components and Technology Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 58th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2008.4550037","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

A high speed shear test of solder ball at different shear angles has been developed and investigated for SnAgCu solder balls. The objective of the test is to introduce vertical loading component in the high speed shear test and to study intermetallic response of different solder balls. The shear test is performed at three angles of attack e. g. 3, 5 and 10 degree. The basic shear tester allow high speed shear tool movement of up to 4000 mm per second, and capture the load-displacement curve experienced by the shear tool. Using this setup, high-speed shear characterization has been carried out on microBGA sample with Sn3Ag0.5Cu and Sn1Ag0.5Cu solder on Ni/Au pad finish. In this paper, the effect of angle shear at high speed on these SnAgCu BGA balls is presented, with the details of load-displacement response and failure mode for these solder balls. Generally all the samples show changes in ductile-to-brittle failure as shear speed increases. The angled shear test lead to down shift of ductile-brittle transition to occur at lower shear speed with larger shear angle. It is found to improve sensitivity in revealing brittle failure for solder ball characterization.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
SnAgCu焊球的角度高应变速率剪切试验
开发并研究了SnAgCu焊锡球在不同剪切角下的高速剪切试验。试验的目的是在高速剪切试验中引入垂直加载分量,研究不同焊料球的金属间响应。剪切试验在3个攻角下进行,即3度、5度和10度。基本剪切测试仪允许高速剪切工具移动高达每秒4000毫米,并捕获剪切工具所经历的载荷-位移曲线。利用该装置,在Ni/Au焊盘表面采用Sn3Ag0.5Cu和Sn1Ag0.5Cu焊料对微bga样品进行了高速剪切表征。本文研究了高速角剪切对SnAgCu BGA焊锡球的影响,并详细介绍了这些焊锡球的载荷-位移响应和失效模式。随着剪切速度的增加,所有试样的韧性-脆性破坏均发生变化。角剪试验在剪切速度较低、剪切角较大的情况下,导致韧性-脆性转变发生下移。发现该方法提高了锡球表征中显示脆性破坏的灵敏度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Effects of warpage on fatigue reliability of solder bumps: Experimental and analytical studies Novel nonconductive adhesives/films with carbon nanotubes for high performance interconnects Methodology for modeling substrate warpage using copper trace pattern implementation Robust design of third level packaging in portable electronics: Solder joint reliability under dynamic mechanical loading Synthesizing SPICE-compatible models of power delivery networks with resonance effect by time-domain waveforms
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1