D. Mannath, V. Montaño-Martinez, I. Syllaios, S. Bhatara, M. Attaluri, Z. Parkar, S. Ang
{"title":"A reduced-cost Built-in Self Test for an FM receiver","authors":"D. Mannath, V. Montaño-Martinez, I. Syllaios, S. Bhatara, M. Attaluri, Z. Parkar, S. Ang","doi":"10.1109/DCAS.2010.5955036","DOIUrl":null,"url":null,"abstract":"This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%.","PeriodicalId":405694,"journal":{"name":"2010 IEEE Dallas Circuits and Systems Workshop","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Dallas Circuits and Systems Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DCAS.2010.5955036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%.