{"title":"The ATDP suite structure for adaptive testing of electronic system states","authors":"I. Magda, A. Pashchenko, I. Shapoval, V. Novikov","doi":"10.1109/CRMICO.2002.1137329","DOIUrl":null,"url":null,"abstract":"The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.","PeriodicalId":378024,"journal":{"name":"12th International Conference Microwave and Telecommunication Technology","volume":"29 24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"12th International Conference Microwave and Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2002.1137329","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.
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