{"title":"A Multi-page Cell Architecture For High-speed Programming Multi-level NAND Flash Memories","authors":"Takeuchi, Tanaka, Tanzawa","doi":"10.1109/VLSIC.1997.623810","DOIUrl":null,"url":null,"abstract":"To realize low-cost, highly reliable, high-speed pro- gramming, and high-density multilevel flash memories, a mul- tipage cell architecture has been proposed. This architecture enables both precise control of the of a memory cell and fast programming without any area penalty. In the case of a four-level cell, a high programming speed of 236 s/512 bytes or 2.2 Mbytes/s can be obtained, which is 2.3 times faster than the conventional method. A small die size can be achieved with the newly developed compact four-level column latch circuit. A preferential page select method has also been proposed so as to improve the data retention characteristics. The IC error rate can be decreased by as much as 43%, and a highly reliable operation can be realized.","PeriodicalId":175678,"journal":{"name":"Symposium 1997 on VLSI Circuits","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"48","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium 1997 on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1997.623810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 48
Abstract
To realize low-cost, highly reliable, high-speed pro- gramming, and high-density multilevel flash memories, a mul- tipage cell architecture has been proposed. This architecture enables both precise control of the of a memory cell and fast programming without any area penalty. In the case of a four-level cell, a high programming speed of 236 s/512 bytes or 2.2 Mbytes/s can be obtained, which is 2.3 times faster than the conventional method. A small die size can be achieved with the newly developed compact four-level column latch circuit. A preferential page select method has also been proposed so as to improve the data retention characteristics. The IC error rate can be decreased by as much as 43%, and a highly reliable operation can be realized.