{"title":"Measuring dynamic phenomena at the sub-micron scale","authors":"J. Soria, O. Amili, C. Atkinson","doi":"10.1109/ICONN.2008.4639263","DOIUrl":null,"url":null,"abstract":"Measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.","PeriodicalId":192889,"journal":{"name":"2008 International Conference on Nanoscience and Nanotechnology","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Nanoscience and Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICONN.2008.4639263","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.
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