The Validity of Retiming Sequential Circuits

V. Singhal, C. Pixley, R. Rudell, R. Brayton
{"title":"The Validity of Retiming Sequential Circuits","authors":"V. Singhal, C. Pixley, R. Rudell, R. Brayton","doi":"10.1145/217474.217548","DOIUrl":null,"url":null,"abstract":"Retiming has been proposed as an optimization step for sequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so changes the number of latches and the longest path delay between the latches. In this paper we show by example that retiming a design may lead to differing simulation results when the retimed design replaces the original design. We also show, by example, that retiming may not preserve the testability of a sequential test sequence for a given stuck-at fault as measured by a simulator. We identify the cause of the problemas forward retiming moves across multiple-fanout points in the circuit. The primary contribution of this paper is to show that, while an accurate logic simulation may distinguish the retimed circuit fromthe original circuit, a conservative three-valued simulator cannot do so. Hence, retiming is a safe operation when used in a design methodology based on conservative three-valued simulation starting each latch with the unknown value.","PeriodicalId":422297,"journal":{"name":"32nd Design Automation Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/217474.217548","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 40

Abstract

Retiming has been proposed as an optimization step for sequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so changes the number of latches and the longest path delay between the latches. In this paper we show by example that retiming a design may lead to differing simulation results when the retimed design replaces the original design. We also show, by example, that retiming may not preserve the testability of a sequential test sequence for a given stuck-at fault as measured by a simulator. We identify the cause of the problemas forward retiming moves across multiple-fanout points in the circuit. The primary contribution of this paper is to show that, while an accurate logic simulation may distinguish the retimed circuit fromthe original circuit, a conservative three-valued simulator cannot do so. Hence, retiming is a safe operation when used in a design methodology based on conservative three-valued simulation starting each latch with the unknown value.
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时序电路重定时的有效性
重新定时已被提出作为一个优化步骤的顺序电路表示在网络列表级。重新定时将锁存器移动到逻辑门上,这样做会改变锁存器的数量和锁存器之间的最长路径延迟。在本文中,我们通过实例表明,当重新定时设计取代原始设计时,重新定时设计可能导致不同的仿真结果。我们还通过实例表明,重新计时可能不会保留由模拟器测量的给定卡在故障的连续测试序列的可测试性。我们确定了问题的原因,向前重定时移动跨越电路中的多个扇出点。本文的主要贡献是表明,虽然精确的逻辑仿真可以区分重新计时电路和原始电路,但保守的三值模拟器无法做到这一点。因此,在基于保守的三值模拟的设计方法中,用未知值启动每个锁存器时,重定时是一种安全的操作。
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