A. Letichevsky, Oleksandr A. Letychevskyi, V. Peschanenko
{"title":"Symbolic Modelling in White-Box Model-Based Testing","authors":"A. Letichevsky, Oleksandr A. Letychevskyi, V. Peschanenko","doi":"10.1109/AIMS.2015.46","DOIUrl":null,"url":null,"abstract":"This paper outlines the development of symbolic modelling in white-box testing technology within the scope of an insertion modelling system (IMS). It implements the symbolic execution of the tested system and generate traces that contain a scenario of system behaviour. The obtained traces were checked for conformance with either a formal model for system specifications or a design model. This technique provides for the possibility of obtaining a good index of code line coverage that is highly recommended in the testing of safety-critical systems.","PeriodicalId":121874,"journal":{"name":"2015 3rd International Conference on Artificial Intelligence, Modelling and Simulation (AIMS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 3rd International Conference on Artificial Intelligence, Modelling and Simulation (AIMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIMS.2015.46","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper outlines the development of symbolic modelling in white-box testing technology within the scope of an insertion modelling system (IMS). It implements the symbolic execution of the tested system and generate traces that contain a scenario of system behaviour. The obtained traces were checked for conformance with either a formal model for system specifications or a design model. This technique provides for the possibility of obtaining a good index of code line coverage that is highly recommended in the testing of safety-critical systems.
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