Novel AlGaN/GaN SBDs with nanoscale multi-channel for gradient 2DEG modulation

A. Zhang, Qi Zhou, Chao Yang, Yuanyuan Shi, Changxu Dong, Tong Liu, Yijun Shi, Wanjun Chen, Zhaoji Li, Bo Zhang
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引用次数: 5

Abstract

Novel lateral AlGaN/GaN Schottky barrier diodes (SBDs) featuring nanoscale multi-channel for gradient two-dimensional electron gas (2DEG) modulation have been proposed and successfully demonstrated on silicon substrates. The 5 °C low temperature plasma etching with improved resolution is developed to form the nanoscale trenches. Due to the aspect ratio dependent etching, the trenches with different widths and depths can be fabricated in one step etching process. Owing to the small discontinuous etching area of the nanoscale trenches, the lattice strain presented in the original AlGaN/GaN heterostructure is marginally modified. Hence the piezoelectric polarization induced 2DEG can be well maintained and gradually modulated beneath the Schottky contact, which is beneficial for a low turn-on ( VT) and high breakdown voltage (BV). The fabricated SBDs exhibit uniform VT of 0.61±0.02 V and maximum BV of 1317 V. The proposed nanoscale multi-channel structure can also be applied in the gate structure design for normally-off GaN high electron mobility transistors (HEMTs) as well as edge termination for electric-field distribution optimization of power devices.
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具有纳米级多通道梯度2DEG调制的新型AlGaN/GaN sbd
提出了一种具有纳米级多通道梯度二维电子气体(2DEG)调制的新型横向AlGaN/GaN肖特基势垒二极管(sdd),并成功地在硅衬底上进行了演示。采用5°C低温等离子体刻蚀技术,提高了分辨率,形成了纳米级沟槽。由于采用了依赖于宽高比的刻蚀方法,可以在一次刻蚀过程中制备出不同宽度和深度的沟槽。由于纳米级沟槽的不连续蚀刻面积小,原始AlGaN/GaN异质结构中的晶格应变被轻微改变。因此,压电极化诱导的2DEG可以在肖特基接触下得到良好的维持和逐渐调制,这有利于低导通(VT)和高击穿电压(BV)。所制备的sdd具有均匀的VT为0.61±0.02 V,最大BV为1317 V。所提出的纳米尺度多沟道结构还可以应用于常关GaN高电子迁移率晶体管(hemt)的栅极结构设计以及功率器件电场分布优化的边缘终止。
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