Thermal resistance measurements of the surfaces of various materials in room temperature to 50 K

Abstract

Measurements of transport parameters of thermoelectric semiconductors need to control the temperature profile of the samples. Therefore, the appropriate materials should be employed for the sample-base and the electrodes in the different experiments. Similar problems occur when a thermoelectric element is set into an instrument. We measured the thermal resistances of the interfaces on various conditions from room temperature to 50 K. Furthermore, we separated the thermal resistances into two parts: those of the material itself and its pure interfaces.