High-speed optical beam scanning using KTN crystal

T. Sakamoto, S. Toyoda, M. Ueno, J. Kobayashi
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引用次数: 2

Abstract

500 kHz optical beam scanning with a full scan angle of over 100 mrad is demonstrated using a potassium tantalite niobate (KTa1-xNbxO3, KTN) deflector. To suppress any heating of the KTN chips during the high frequency operation and to have a sufficient interaction length to achieve more than 100 mrad deflection, the deflector consists of two KTN chips each of which has a pentagon-shaped electrode surface whose longest side is shortened to 1.5 mm. The full scan angle of the deflector is measured and the KTN temperature dependence of the permittivity accounts for the voltage and frequency dependence of the scan angle.
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利用KTN晶体进行高速光束扫描
使用铌酸钾(KTa1-xNbxO3, KTN)偏转器演示了500 kHz光束扫描,全扫描角超过100 mrad。为了抑制KTN芯片在高频工作期间的任何加热,并有足够的相互作用长度来实现超过100 mrad的偏转,偏转板由两个KTN芯片组成,每个芯片都有一个五边形的电极表面,其最长的一面缩短到1.5 mm。测量了偏转板的全扫描角,并且介电常数的KTN温度依赖性解释了扫描角的电压和频率依赖性。
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