Test-based model generation for legacy systems

H. Hungar, T. Margaria, B. Steffen
{"title":"Test-based model generation for legacy systems","authors":"H. Hungar, T. Margaria, B. Steffen","doi":"10.1109/TEST.2003.1271084","DOIUrl":null,"url":null,"abstract":"We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes. We gather observations via an automated test environment and systematically extend available test suites according to learning procedures. Testing plays two roles here: (i) as an application domain and (ii) as the enabling technology for the adopted learning technique. The benefits include enhanced error detection and diagnosis, both during the testing phase and the online test of deployed systems at customer sites.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"48","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 48

Abstract

We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes. We gather observations via an automated test environment and systematically extend available test suites according to learning procedures. Testing plays two roles here: (i) as an application domain and (ii) as the enabling technology for the adopted learning technique. The benefits include enhanced error detection and diagnosis, both during the testing phase and the online test of deployed systems at customer sites.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
为遗留系统生成基于测试的模型
我们研究了系统级测试技术的适用性扩展,以构建被测(遗留)系统的一致模型,这些模型被视为黑盒。我们通过自动化测试环境收集观察结果,并根据学习过程系统地扩展可用的测试套件。测试在这里扮演两个角色:(i)作为应用领域,(ii)作为所采用的学习技术的启用技术。其好处包括在测试阶段和客户站点部署系统的在线测试期间增强错误检测和诊断。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Fault pattern oriented defect diagnosis for memories A built-in self-repair scheme for semiconductor memories with 2-d redundancy Cost-effective approach for reducing soft error failure rate in logic circuits A new maximal diagnosis algorithm for bus-structured systems Test vector generation based on correlation model for ratio-I/sub DDQ/
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1