A novel model for simulation of RF oscillator phase noise

Abstract

A novel model of the RF oscillator's phase noise process has been provided in this work, resulting in a more accurate model than the conventional Wiener process. The phase noise is considered as the integration of frequency noise which consists of white and flicker noise, whereas the Wiener process is the integration result of white noise only. Analytical expressions of the oscillator RMS jitter and the Single-Side Band (SSB) phase noise (L) are presented and compared to the simulation and measurement results for verification. The relationship between 1/f3-1/f2 corner frequency in the PSD and the slope transition corner in RMS jitter plot is consistent with the analytical and measurement results. The simulation result shows that the PSD of the oscillator becomes Gaussian close to the carrier, followed by power-law regions, in consistense with the analytical expression.