Strong self-testability for data paths high-level synthesis

Abstract

In this paper, we introduce strong self-testability for data paths at register transfer level (RTL). A high-level synthesis scheme is proposed for producing such strongly self-testable data paths. This is achieved by incorporating testability constraints during processes of register assignment and interconnection assignment. This method is based on the use of test resources reusability to improve the self-testability of data path. Experimental results are presented to demonstrate the effectiveness of the proposed approach.