Laboratory Fixture for Measurement of Dielectric Absorption of Capacitors

Abstract

Dielectric absorption is known as one of the capacitors parasitic effects. Underestimation of the phenomena can have frustrating consequences starting from unexpected behavior of the circuits through the damage or malfunction of the sensitive electronics up to the eventuality of shock hazard to the device's operator. The paper presents a new and alternative method to test the phenomenon. Contrary to the traditional approach the method is based on discharging of capacitor using various loads. To implement the method there was designed and implemented a specialized measuring fixture. The paper describes a principle of the method, a principle of the measuring fixture and practical results as well.