A novel design method of EMC anechoic chamber using phase and magnitude deviation

T. Izumi, H. Arai
{"title":"A novel design method of EMC anechoic chamber using phase and magnitude deviation","authors":"T. Izumi, H. Arai","doi":"10.1109/APMC.2012.6421852","DOIUrl":null,"url":null,"abstract":"EMC(Electro Magnetic Compatibility) tests have been inevitable for electronic products of recent years. Most of the products are tested in anechoic chamber or open site, but in an experiment, it is susceptible to error caused by reflections from the wall because absolute free space could not be achieved with absorber. Then an evaluation value for constructing a better condition of anechoic chamber in which the error is reduced, is required. To design high performance measurement environment and anechoic chamber, we propose an evaluation value using the phase difference between direct wave and reflected wave. The value is introduced with the investigation of the error source by ray-tracing method. The results using proposed value for locating the transmitting point show that it is possible to improve the measurement environment by calculation. Moreover this indicates that the better design of anechoic chambers can be obtained by this value.","PeriodicalId":359125,"journal":{"name":"2012 Asia Pacific Microwave Conference Proceedings","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Asia Pacific Microwave Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.2012.6421852","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

EMC(Electro Magnetic Compatibility) tests have been inevitable for electronic products of recent years. Most of the products are tested in anechoic chamber or open site, but in an experiment, it is susceptible to error caused by reflections from the wall because absolute free space could not be achieved with absorber. Then an evaluation value for constructing a better condition of anechoic chamber in which the error is reduced, is required. To design high performance measurement environment and anechoic chamber, we propose an evaluation value using the phase difference between direct wave and reflected wave. The value is introduced with the investigation of the error source by ray-tracing method. The results using proposed value for locating the transmitting point show that it is possible to improve the measurement environment by calculation. Moreover this indicates that the better design of anechoic chambers can be obtained by this value.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
提出了一种利用相位和幅值偏差设计电磁兼容消声室的新方法
近年来,对电子产品进行电磁兼容测试已成为一种必然。大多数产品的测试是在消声室或露天场地进行的,但在实验中,由于吸收器无法获得绝对的自由空间,因此容易受到墙壁反射的影响而产生误差。然后,需要一个评价值,以建立一个更好的消声室条件,以减少误差。为了设计高性能的测量环境和消声室,我们提出了一个利用直波和反射波之间的相位差的评价值。通过光线追踪法对误差源的研究,引入了该值。利用所提出的数值定位发射点的结果表明,通过计算可以改善测量环境。这说明利用该值可以得到较好的消声室设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An improved cylindrical NFFFT for compact measurement facilities Solenoidal transformers for magnetic materials integration A CMOS low loss/high linearity passive mixer for 2.45 GHz low power applications CMOS device de-embedding without impedance standard substrate calibration for on-wafer scattering parameter measurements Fabrication of AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate with slant field plates using deep-UV lithography featuring 5W/mm power density at X-band
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1