{"title":"VTest program mixed-signal virtual test approach","authors":"E.G. Perkins, J.J. Wong","doi":"10.1109/AUTEST.1997.633554","DOIUrl":null,"url":null,"abstract":"The VTest (Virtual Test) Program is producing an open environment and a methodology for Virtual Test development of TPSs for mixed-signal PCBs/LRMs. The VTest effort is paving the way for the integration of Design and Test by providing an EDA-based system solution emphasizing Design for Test and the Re-Use of Design information in Test Development. The VTest solution incorporates the CAE/CAD/CAT software tools necessary for virtual test of digital, analog and mixed-signal technology PCBs/LRMs, as well as the tools and methodologies that support the use of automatic test program generation for multiple target testers. This paper discusses the VTest solution architecture and the VTest approach to mixed-signal TPS development.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633554","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The VTest (Virtual Test) Program is producing an open environment and a methodology for Virtual Test development of TPSs for mixed-signal PCBs/LRMs. The VTest effort is paving the way for the integration of Design and Test by providing an EDA-based system solution emphasizing Design for Test and the Re-Use of Design information in Test Development. The VTest solution incorporates the CAE/CAD/CAT software tools necessary for virtual test of digital, analog and mixed-signal technology PCBs/LRMs, as well as the tools and methodologies that support the use of automatic test program generation for multiple target testers. This paper discusses the VTest solution architecture and the VTest approach to mixed-signal TPS development.
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