{"title":"Symbolic fault modeling for switched-capacitor circuits","authors":"J. Cheng, G. Shi, Andy Tai, F. Lee","doi":"10.1109/TENCON.2013.6719067","DOIUrl":null,"url":null,"abstract":"A symbolic construction method allowing for parameter limit operation is proposed. Switched-capacitor circuits can be analyzed with this method by creating a symbolic z-domain transfer function represented in the form of a Binary Decision Diagram (BDD). Manipulating the symbols in BDD can simulate a variety of circuit faults, such as switch faults, capacitor faults, and opamp gain faults. Implementation methods are presented and illustration examples are provided.","PeriodicalId":425023,"journal":{"name":"2013 IEEE International Conference of IEEE Region 10 (TENCON 2013)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference of IEEE Region 10 (TENCON 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.2013.6719067","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A symbolic construction method allowing for parameter limit operation is proposed. Switched-capacitor circuits can be analyzed with this method by creating a symbolic z-domain transfer function represented in the form of a Binary Decision Diagram (BDD). Manipulating the symbols in BDD can simulate a variety of circuit faults, such as switch faults, capacitor faults, and opamp gain faults. Implementation methods are presented and illustration examples are provided.
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