Integrating Compiler Driven Transformation and Simulated Annealing Based Floorplan for Optimized Transient Fault Tolerant DSP Cores

Abstract

Reliability of electronic devices in sub-nanometer technology scale has become a major concern. However, demand for battery operated low power, high performance devices necessitates technology scaling. To meet these contradictory design goals optimization and reliability must be performed simultaneously. This paper proposes by integrating compiler driven transformation and simulated annealing based optimization process for generating optimized low cost transient fault tolerant DSP core. The case study on FIR filter shows improved performance (in terms of reduced area and delay) of proposed approach in comparison to state-of-art transient fault tolerant approach.