A Realistic March-12N Test And Diagnosis Algorithm For SRAM Memories

Abstract

Testing and diagnosis techniques play a key role during the advance of semiconductor memory technologies. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and yield improvement. The test and diagnosis complexity are 12N for bit-oriented diagnosis algorithm, N is the number of addresses is proposed for fault detection and diagnosis. Using the proposed march-based algorithm (march-12N), 100% of the faults under the fault model are covered and partial distinguished. They also can locate the faulty cells and identify their types. The complete fault and diagnosis procedures for state coupling faults, idempotent coupling faults and inversion coupling faults are written in this paper. Therefore, all the coupling faults that occur in SRAM memories are verified and proved the valid results. Furthermore, the realistic 12N test and diagnosis algorithm has shown the improvement of diagnostic resolution and test time.