Improvement of Thermostability and Probable Voltage of Hally Arsenide Layers by Ion-Radiation Modification in the Design of the Resistors of Integrated Schemes

I. Rodionov, I. Perinskaya, L. Kuts
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引用次数: 2

Abstract

The influence of the irradiation process with helium ions of a matrix from gallium arsenide was revealed experimentally to form isolation regions and re-introduce helium ions in order to obtain electrically isolated resistors of integrated circuits of microwave devices. The empirical dependences of the resistance of epitaxial gallium arsenide on the accelerating voltage of helium ions are analyzed and the regimes of ion-beam (He+) modification of gallium arsenide are determined to create local isolating regions of resistors. The established physical and technical parameters of ion-beam modification have created the prerequisites for the development of an advanced technology for fabricating electrically isolated resistors with increased thermal stability and the necessary breakdown voltage of local insulating layers of epitaxial gallium arsenide, which in turn significantly expands the possibilities for the design of modern microcircuits.
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集成方案电阻器设计中离子辐射修饰提高砷化镓层热稳定性和可能电压
实验揭示了砷化镓基体氦离子辐照过程对形成隔离区并重新引入氦离子的影响,从而获得微波器件集成电路的电隔离电阻。分析了砷化镓外延电阻与氦离子加速电压的经验依赖关系,并确定了砷化镓离子束(He+)修饰的机制,以形成电阻的局部隔离区。离子束修饰的既定物理和技术参数为制造具有更高热稳定性和必要的局部砷化镓绝缘层击穿电压的电隔离电阻器的先进技术的发展创造了先决条件,这反过来又大大扩展了现代微电路设计的可能性。
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