{"title":"INAP protocol conformance testing","authors":"Sangki Kim, Sungun Kim","doi":"10.1109/INW.1997.603084","DOIUrl":null,"url":null,"abstract":"This paper describes a research result on automatic generation of abstract test cases from INAP protocol in formal specifications by using and applying many existing related algorithms and techniques such as the testing framework, rural Chinese postman tour and UTO (Unique Input Output) sequence concepts. We use the I/OFSM (Input/Output Finite State Machine) generated from SDL specifications and a characterizing sequence, called Unique Input/Output (UIO) sequence, is defined for the I/O FSM. The UIO sequence is combined with the concept of rural Chinese postman tour, without reliable reset capability, to obtain an optimal test sequence. To develop this method, first of all, we establish a framework leading to formal testing methodology which can be used to assess the conformance of an IUT (Implementation Under Test) to the behaviours specified in an I/OFSM which is equivalent to corresponding FDT (Formal Description Technique) specification. By this framework, we present a methodology for automatic test generation from FDT specifications. A prototype of the proposed framework has been built with special attention to real application in order to generate the executable test cases in an automatic way.","PeriodicalId":395317,"journal":{"name":"IEEE Intelligent Network Workshop in '97. Proceedings. 'Meeting the Challenges of Converging Networks and Global Demand'","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Intelligent Network Workshop in '97. Proceedings. 'Meeting the Challenges of Converging Networks and Global Demand'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INW.1997.603084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper describes a research result on automatic generation of abstract test cases from INAP protocol in formal specifications by using and applying many existing related algorithms and techniques such as the testing framework, rural Chinese postman tour and UTO (Unique Input Output) sequence concepts. We use the I/OFSM (Input/Output Finite State Machine) generated from SDL specifications and a characterizing sequence, called Unique Input/Output (UIO) sequence, is defined for the I/O FSM. The UIO sequence is combined with the concept of rural Chinese postman tour, without reliable reset capability, to obtain an optimal test sequence. To develop this method, first of all, we establish a framework leading to formal testing methodology which can be used to assess the conformance of an IUT (Implementation Under Test) to the behaviours specified in an I/OFSM which is equivalent to corresponding FDT (Formal Description Technique) specification. By this framework, we present a methodology for automatic test generation from FDT specifications. A prototype of the proposed framework has been built with special attention to real application in order to generate the executable test cases in an automatic way.
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INAP协议一致性测试
本文介绍了利用现有的测试框架、中国农村邮差漫游、UTO (Unique Input Output,唯一输入输出)序列概念等相关算法和技术,在形式化规范中自动生成INAP协议抽象测试用例的研究成果。我们使用从SDL规范生成的I/OFSM(输入/输出有限状态机),并为I/OFSM定义了一个称为唯一输入/输出(UIO)序列的特征序列。该UIO序列与中国农村邮差漫游的概念相结合,不具备可靠的重置能力,以获得最优测试序列。为了开发这种方法,首先,我们建立了一个框架,导致正式的测试方法,该方法可用于评估IUT(测试下实现)与I/OFSM中指定的行为的一致性,这相当于相应的FDT(正式描述技术)规范。通过这个框架,我们提出了一种从FDT规范自动生成测试的方法。为了能够自动生成可执行的测试用例,本文特别关注实际应用,构建了所提出框架的原型。
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