{"title":"INAP protocol conformance testing","authors":"Sangki Kim, Sungun Kim","doi":"10.1109/INW.1997.603084","DOIUrl":null,"url":null,"abstract":"This paper describes a research result on automatic generation of abstract test cases from INAP protocol in formal specifications by using and applying many existing related algorithms and techniques such as the testing framework, rural Chinese postman tour and UTO (Unique Input Output) sequence concepts. We use the I/OFSM (Input/Output Finite State Machine) generated from SDL specifications and a characterizing sequence, called Unique Input/Output (UIO) sequence, is defined for the I/O FSM. The UIO sequence is combined with the concept of rural Chinese postman tour, without reliable reset capability, to obtain an optimal test sequence. To develop this method, first of all, we establish a framework leading to formal testing methodology which can be used to assess the conformance of an IUT (Implementation Under Test) to the behaviours specified in an I/OFSM which is equivalent to corresponding FDT (Formal Description Technique) specification. By this framework, we present a methodology for automatic test generation from FDT specifications. A prototype of the proposed framework has been built with special attention to real application in order to generate the executable test cases in an automatic way.","PeriodicalId":395317,"journal":{"name":"IEEE Intelligent Network Workshop in '97. Proceedings. 'Meeting the Challenges of Converging Networks and Global Demand'","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Intelligent Network Workshop in '97. Proceedings. 'Meeting the Challenges of Converging Networks and Global Demand'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INW.1997.603084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes a research result on automatic generation of abstract test cases from INAP protocol in formal specifications by using and applying many existing related algorithms and techniques such as the testing framework, rural Chinese postman tour and UTO (Unique Input Output) sequence concepts. We use the I/OFSM (Input/Output Finite State Machine) generated from SDL specifications and a characterizing sequence, called Unique Input/Output (UIO) sequence, is defined for the I/O FSM. The UIO sequence is combined with the concept of rural Chinese postman tour, without reliable reset capability, to obtain an optimal test sequence. To develop this method, first of all, we establish a framework leading to formal testing methodology which can be used to assess the conformance of an IUT (Implementation Under Test) to the behaviours specified in an I/OFSM which is equivalent to corresponding FDT (Formal Description Technique) specification. By this framework, we present a methodology for automatic test generation from FDT specifications. A prototype of the proposed framework has been built with special attention to real application in order to generate the executable test cases in an automatic way.