Analysis simulation of facet temperature in semiconductor lasers

X. Zheng, Zaijin Li, Te Li, P. Lu, Yong Wang, Y. Zou, Y. Qu, B. Bo, Guojun Liu, Xiao-hui Ma
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Abstract

This paper analyzes the damage mechanism of the semiconductor laser cavity surface. Catastrophic optical damage (COD) is one of major mechanisms, which drastically limits laser lifetime and emitted optical power. This paper builds the theoretical model that based on heat source with injection current and optical power to describe the temperature distribution of laser. Through analyzing the edge-emitting semiconductor lasers by using ANSYS, we can describe change of facet temperature distribution before and after the COD events. Through the results of simulation, we can get the conclusion that the main reason of COD is oxidation of the semiconductor laser in facet which caused by optical absorption.
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半导体激光器表面温度的分析仿真
分析了半导体激光腔体表面的损伤机理。灾难性光损伤(COD)是严重限制激光寿命和发射光功率的主要机制之一。本文建立了基于注入电流和光功率的热源来描述激光温度分布的理论模型。利用ANSYS软件对边缘发射半导体激光器进行分析,可以描述COD事件发生前后激光器表面温度分布的变化。通过模拟结果,我们可以得出COD的主要原因是由于光吸收引起的半导体激光器表面氧化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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