P. Franzon, D. van den Bout, J. Paulos, T. Miller, W. Snyder, T. Nagle, Wentai Liu
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引用次数: 2
Abstract
Many of the defect tolerant techniques employed to achieve wafer-scale integration can also be used to construct flexible and scalable architectures. These techniques are applied to two artificial neural networks: a feed-forward analog network with backpropagation and an efficient digital recurrent network.<>
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