{"title":"A unified approach to random-fatigue reliability quantification under random loading","authors":"D. Kececioglu, Mingxiao Jiang, Fengbin Sun","doi":"10.1109/RAMS.1998.653797","DOIUrl":null,"url":null,"abstract":"The random fatigue damage accumulation under stationary random loading, narrow-band or wide-band, has been quantified by numerous authors. It is shown in this paper that their results can be applied to random fatigue crack growth under random loading. The random fatigue life distribution is obtained, which is found to be a Birnbaum-Saunder's distribution. Then, the fatigue life statistics and the associated reliability are quantified.","PeriodicalId":275301,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1998.653797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
The random fatigue damage accumulation under stationary random loading, narrow-band or wide-band, has been quantified by numerous authors. It is shown in this paper that their results can be applied to random fatigue crack growth under random loading. The random fatigue life distribution is obtained, which is found to be a Birnbaum-Saunder's distribution. Then, the fatigue life statistics and the associated reliability are quantified.
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