Effect of High Impulse Voltage on Potential Induced Degradation in Crystalline Silicon Photovoltaic Modules

Suy Kimsong, T. Kaneko, Y. Hara, A. Masuda, M. Isomura
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引用次数: 2

Abstract

Potential induced degradation (PID) is an undesirable phenomenon in crystalline Si photovoltaic (PV) modules, since it causes a performance loss in the PV modules. Meanwhile, PV systems installed in the large open-area have a possibility to be exposed to lightning strike, however there were few studies about effects of lightning strike on crystalline Si PV modules. In this study, we focused on effect of lightning impulse voltage on PID in crystalline Si PV modules. Lightning strike was simulated by a high impulse voltage generator. To reveal the effects of impulse voltage on PID in the modules, several investigations were used such as dark current-voltage measurement, electroluminescence image, and leakage current measurement. As a result, the lightning impulse voltages (−20 kV, −40kV, and +20 kV) completely accelerated the PID in the crystalline Si PV modules.
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高冲击电压对晶体硅光伏组件电位诱导降解的影响
电位诱导降解(PID)是晶体硅光伏(PV)组件中不希望出现的现象,因为它会导致光伏组件的性能损失。同时,安装在大面积开阔地的光伏系统有遭受雷击的可能,但关于雷击对晶体硅光伏组件影响的研究较少。在本研究中,我们重点研究了雷击电压对晶体硅光伏组件中PID的影响。用高冲击电压发生器模拟雷击。为了揭示冲击电压对模块中PID的影响,采用了暗电流-电压测量、电致发光成像和漏电流测量等方法。因此,雷击电压(−20kv,−40kV和+ 20kv)完全加速了晶体硅光伏组件中的PID。
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