Performance-Aware Interconnect Delay Insertion Against EM Side-Channel Attacks

Minmin Jiang, V. Pavlidis
{"title":"Performance-Aware Interconnect Delay Insertion Against EM Side-Channel Attacks","authors":"Minmin Jiang, V. Pavlidis","doi":"10.1109/SLIP52707.2021.00013","DOIUrl":null,"url":null,"abstract":"Random Delay Insertion (RDI) has been shown to be an effective countermeasure to side-channel attacks (SCAs) on on-chip power networks. RDI effectively reduces the correlation between the power dissipation and the processed data. However, random delay insertion can degrade circuit performance. Considering the theoretical benefits of delay insertion, this paper proposes a novel methodology that adds delay to interconnect buses to mitigate electromagnetic (EM) SCAs without degrading bus latency. The methodology comprises an efficient delay insertion scheme that hinders electromagnetic attacks, where the delay is inserted into the boundary lines of the bus. As the worst-case bus latency is determined by the lines that drive the maximum cross-coupling capacitance, inserting delay at the boundary lines does not affect the circuit performance as these lines always drive a lower capacitance. The inserted delay improves the security strength of the bus to EM attacks due to the reduction of the correlation between EM emissions and transmitted data, making the methodology effective and directly applicable with negligible overhead. The technique is applied to interposer based off-chip memory buses due to the increasing adoption of 2.5-D integrated systems (although the method is effectively applicable to any interconnect bus). Simulation results show that the technique decreases SNR below 1, which makes EM attacks unsuccessful, and does not increase the (worst-case) bus latency, sustaining the overall circuit performance. Consequently, the proposed method provides a superior EM SCA mitigation method compared to the state-of-the-art. Indeed, theoretical analysis and simulation results demonstrate that the new technique can offer the same level of protection against SCAs with better performance than other hardware RDI countermeasures.","PeriodicalId":358944,"journal":{"name":"2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SLIP52707.2021.00013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Random Delay Insertion (RDI) has been shown to be an effective countermeasure to side-channel attacks (SCAs) on on-chip power networks. RDI effectively reduces the correlation between the power dissipation and the processed data. However, random delay insertion can degrade circuit performance. Considering the theoretical benefits of delay insertion, this paper proposes a novel methodology that adds delay to interconnect buses to mitigate electromagnetic (EM) SCAs without degrading bus latency. The methodology comprises an efficient delay insertion scheme that hinders electromagnetic attacks, where the delay is inserted into the boundary lines of the bus. As the worst-case bus latency is determined by the lines that drive the maximum cross-coupling capacitance, inserting delay at the boundary lines does not affect the circuit performance as these lines always drive a lower capacitance. The inserted delay improves the security strength of the bus to EM attacks due to the reduction of the correlation between EM emissions and transmitted data, making the methodology effective and directly applicable with negligible overhead. The technique is applied to interposer based off-chip memory buses due to the increasing adoption of 2.5-D integrated systems (although the method is effectively applicable to any interconnect bus). Simulation results show that the technique decreases SNR below 1, which makes EM attacks unsuccessful, and does not increase the (worst-case) bus latency, sustaining the overall circuit performance. Consequently, the proposed method provides a superior EM SCA mitigation method compared to the state-of-the-art. Indeed, theoretical analysis and simulation results demonstrate that the new technique can offer the same level of protection against SCAs with better performance than other hardware RDI countermeasures.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
针对电磁侧信道攻击的性能感知互连延迟插入
随机延迟插入(RDI)已被证明是一种有效的对抗片上电网侧信道攻击(sca)的方法。RDI有效地降低了功耗与处理数据之间的相关性。然而,随机延迟插入会降低电路的性能。考虑到延迟插入的理论好处,本文提出了一种新的方法,在不降低总线延迟的情况下,在互连总线上增加延迟以减轻电磁(EM) sca。该方法包括一个有效的延迟插入方案,阻止电磁攻击,其中延迟插入到总线的边界线。由于最坏情况下的母线延迟是由驱动最大交叉耦合电容的线路决定的,因此在边界线上插入延迟不会影响电路性能,因为这些线路总是驱动较低的电容。由于减少了电磁发射与传输数据之间的相关性,插入的延迟提高了总线对电磁攻击的安全强度,使该方法有效且直接适用,开销可以忽略不计。由于越来越多地采用2.5-D集成系统,该技术被应用于基于中间层的片外存储总线(尽管该方法有效地适用于任何互连总线)。仿真结果表明,该技术将信噪比降低到1以下,使EM攻击不成功,并且不会增加(最坏情况下)总线延迟,保持整体电路性能。因此,与最先进的方法相比,所提出的方法提供了优越的电磁SCA缓解方法。实际上,理论分析和仿真结果表明,新技术可以提供与其他硬件RDI对策相比具有更好性能的相同级别的sca保护。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Reconfigurable on-chip wireless interconnections through optical phased arrays (Invited) Design And Sign-off Methodologies For Wafer-To-Wafer Bonded 3D-ICs At Advanced Nodes (invited) SID-Mesh: Diagonal Mesh Topology for Silicon Interposer in 2.5D NoC with Introducing a New Routing Algorithm A Novel System-Level Physics-Based Electromigration Modelling Framework: Application to the Power Delivery Network Design and System Technology Co-Optimization Sensitivity Prediction for VLSI Technology Development using Machine Learning
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1