{"title":"Accurate modeling of open-ended coaxial sensor by non-uniform FDTD method","authors":"R. Jobava, A. Gheonjian","doi":"10.1109/DIPED.1999.822138","DOIUrl":null,"url":null,"abstract":"The open-ended coaxial sensor is modeled by a non-uniform FDTD method. Such sensors are used for complex permittivity measurements in the MHz-GHz frequency range. The accuracy of the measurements depend greatly on the accuracy of the reflection coefficient computation. The non-uniform grid makes it possible to use very fine discretization in the critical area where the open-end of the coax is attached to the sample. The method can be used to calculate the reflection coefficient for very thin samples.","PeriodicalId":426777,"journal":{"name":"DIPED - 99. Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory. Proceedings of 4th International Seminar/Workshop (IEEE Cat. No.99TH8402)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"DIPED - 99. Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory. Proceedings of 4th International Seminar/Workshop (IEEE Cat. No.99TH8402)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DIPED.1999.822138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The open-ended coaxial sensor is modeled by a non-uniform FDTD method. Such sensors are used for complex permittivity measurements in the MHz-GHz frequency range. The accuracy of the measurements depend greatly on the accuracy of the reflection coefficient computation. The non-uniform grid makes it possible to use very fine discretization in the critical area where the open-end of the coax is attached to the sample. The method can be used to calculate the reflection coefficient for very thin samples.
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