Verilog-A SPICE Model of PECVD SiO2 OTP Memory Device

A.Sai Kumar, S. Chatterjee, M. Suri, S. Sadana, Akash Sharma, Pratiksha, Ashutosh Kumar Singh, A. Chawla, D. Sehgal, H. S. Jatana, U. Ganguly
{"title":"Verilog-A SPICE Model of PECVD SiO2 OTP Memory Device","authors":"A.Sai Kumar, S. Chatterjee, M. Suri, S. Sadana, Akash Sharma, Pratiksha, Ashutosh Kumar Singh, A. Chawla, D. Sehgal, H. S. Jatana, U. Ganguly","doi":"10.1109/MOS-AK.2019.8902433","DOIUrl":null,"url":null,"abstract":"Many emerging electronic devices are being used for computation, storage as well as several other purposes to decrease the scaling requirement of MOSFET. The accurate behavior prediction of such hybrid systems (MOSFET + Emerging) is a challenging task before their co-integration in hardware. This paper presents a Verilog-A compact model for our PECVD SiO2 MIM type one time programmable (OTP) memory device. We show strong agreement between the simulated results and experimental electrical-characterization. The characterization of the devices presents the one time switching from its pristine high resistance state (HRS ∼ GΩ) to extreme low resistance state (LRS ∼ 10Ω). DC and transient simulations of one transistor one OTP (1T1O) illustrates the capability of the proposed model for hybrid circuit simulations for different applications.","PeriodicalId":178751,"journal":{"name":"2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MOS-AK.2019.8902433","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Many emerging electronic devices are being used for computation, storage as well as several other purposes to decrease the scaling requirement of MOSFET. The accurate behavior prediction of such hybrid systems (MOSFET + Emerging) is a challenging task before their co-integration in hardware. This paper presents a Verilog-A compact model for our PECVD SiO2 MIM type one time programmable (OTP) memory device. We show strong agreement between the simulated results and experimental electrical-characterization. The characterization of the devices presents the one time switching from its pristine high resistance state (HRS ∼ GΩ) to extreme low resistance state (LRS ∼ 10Ω). DC and transient simulations of one transistor one OTP (1T1O) illustrates the capability of the proposed model for hybrid circuit simulations for different applications.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Verilog-A PECVD SiO2 OTP内存器件SPICE模型
许多新兴的电子器件正被用于计算、存储以及其他一些目的,以降低MOSFET的缩放要求。这种混合系统(MOSFET + Emerging)在硬件协整之前的准确行为预测是一项具有挑战性的任务。本文介绍了一种用于PECVD SiO2 MIM型一次性可编程(OTP)存储器件的Verilog-A紧凑型模型。我们在模拟结果和实验电特性之间表现出强烈的一致性。器件的特性表现为从原始高电阻状态(HRS ~ GΩ)到极低电阻状态(LRS ~ 10Ω)的一次性切换。一个晶体管一个OTP (1t10)的直流和瞬态仿真说明了所提出的模型对不同应用的混合电路仿真的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Energy Efficient Binary Adders for Error Resilient Applications Performance Evaluation of Gate-All-Around Si Nanowire Transistors with SiGe Strain engineering Charge and Capacitance Compact Model for III-V Quadruple-Gate FETs With Square Geometry Development of Low-Cost Silicon BiCMOS Technology for RF Applications MOS-AK India 2019 Author Index
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1