S. Mahapatra, N. Parihar, S. Mukhopadhyay, N. Goel
{"title":"BTI Analysis Tool (BAT) Model Framework—Generation of Interface Traps","authors":"S. Mahapatra, N. Parihar, S. Mukhopadhyay, N. Goel","doi":"10.1007/978-981-16-6120-4_4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":356407,"journal":{"name":"Recent Advances in PMOS Negative Bias Temperature Instability","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Advances in PMOS Negative Bias Temperature Instability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-16-6120-4_4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
