K. Murakami, Hiroshi Nakamura, T. Oshino, H. Nikaido
{"title":"Tungsten/Carbon Multilayers Prepared By Ion Beam Sputtering","authors":"K. Murakami, Hiroshi Nakamura, T. Oshino, H. Nikaido","doi":"10.1364/sxray.1991.thb4","DOIUrl":null,"url":null,"abstract":"W/C multilayers, well known as good X-ray reflecting mirrors, were prepared by ion beam sputtering. The properties of the multilayers were investigated by low-angle X-ray diffraction, transmission electron microscopy (TEM) observation of the cross section and Auger electron spectroscopy.","PeriodicalId":409291,"journal":{"name":"Soft-X-Ray Projection Lithography","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Soft-X-Ray Projection Lithography","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/sxray.1991.thb4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
W/C multilayers, well known as good X-ray reflecting mirrors, were prepared by ion beam sputtering. The properties of the multilayers were investigated by low-angle X-ray diffraction, transmission electron microscopy (TEM) observation of the cross section and Auger electron spectroscopy.
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